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无权访问的条目 期刊论文
作者:  Zheng ZS;  Liu ZL;  Zhang GQ;  Li N;  Fan K;  Zhang EX;  Yi WB;  Chen M;  Wang X;  Zheng, ZS, Chinese Acad Sci, Inst Semicond, Microelect R&D Ctr, Beijing 100083, Peoples R China.
Adobe PDF(252Kb)  |  收藏  |  浏览/下载:1083/359  |  提交时间:2010/03/17
无权访问的条目 期刊论文
作者:  Zheng ZS;  Liu ZL;  Zhang GQ;  Li N;  Li GH;  Ma HZ;  Zhang EX;  Zhang ZX;  Wang X;  Zheng, ZS, Chinese Acad Sci, Inst Semicond, Microelect R&D Ctr, Beijing 100083, Peoples R China. 电子邮箱地址: zszheng@red.semi.ac.cn
Adobe PDF(104Kb)  |  收藏  |  浏览/下载:1223/445  |  提交时间:2010/03/17
无权访问的条目 期刊论文
作者:  Zheng ZS;  Liu ZL;  Zhang GQ;  Li N;  Fan K;  Zhang EX;  Yi WB;  Chen M;  Wang X;  Zheng, ZS, Chinese Acad Sci, Inst Semicond, Microelect R&D Ctr, Beijing 100083, Peoples R China. 电子邮箱地址: zszheng@red.semi.ac.cn
Adobe PDF(236Kb)  |  收藏  |  浏览/下载:975/238  |  提交时间:2010/03/17
无权访问的条目 期刊论文
作者:  Zheng ZS;  Liu ZL;  Zhang GQ;  Li N;  Fan K;  Zhang EX;  Yi WB;  Chen M;  Wang X;  Zheng, ZS, Chinese Acad Sci, Inst Semicond, Microelect R&D Ctr, Beijing 100083, Peoples R China. 电子邮箱地址: zszheng@red.semi.ac.cn
Adobe PDF(252Kb)  |  收藏  |  浏览/下载:1055/323  |  提交时间:2010/03/17
A silicon capacitive microphone based on oxidized porous silicon sacrificial technology 会议论文
2004 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, Beijing, PEOPLES R CHINA, OCT 18-21, 2004
作者:  Ning, J;  Liu, ZL;  Liu, HZ;  Ge, YC;  Ning, J, Chinese Acad Sci, Microelect R&D Ctr, Inst Semicond, Beijing 100083, Peoples R China.
Adobe PDF(151Kb)  |  收藏  |  浏览/下载:1197/186  |  提交时间:2010/03/29
Silicon Capacitive Microphone  Oxidized Porous Silicon  Sacrificial Layer  
The status, limits and countermeasures in the development of the silicon microelectronics industry 会议论文
2004 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, Beijing, PEOPLES R CHINA, OCT 18-21, 2004
作者:  Liu, ZL;  Liu, ZL, Chinese Acad Sci, Inst Semicond, Microelect R&D Ctr, Beijing 100083, Peoples R China.
Adobe PDF(530Kb)  |  收藏  |  浏览/下载:1198/149  |  提交时间:2010/03/29
Silicon Microelectronics  Cmos  Theoretic Limit  Technologic Limit  Economic Limit  
无权访问的条目 期刊论文
作者:  Shang YC;  Liu ZL;  Wang SR;  Shang YC,Chinese Acad Sci,Microelect R&D Ctr,Inst Semicond,Beijing 100083,Peoples R China.
Adobe PDF(316Kb)  |  收藏  |  浏览/下载:740/273  |  提交时间:2010/08/12