Knowledge Management System Of Institute of Semiconductors,CAS
Accurate vibration detection of a rough surface - art. no. 683118 | |
Zeng, HL; Zhou, Y; Fan, ST; He, J; Zeng, HL, Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China. | |
2008 | |
会议名称 | 2nd Conference on Nanophotonics, Nanostructure and Nanometrology |
会议录名称 | NANOPHOTONICS,NANOSTRUCTURE,AND NANOMETROLOGY II |
页码 | 6831: 83118-83118 |
会议日期 | NOV 12-14, 2007 |
会议地点 | Beijing, PEOPLES R CHINA |
出版地 | 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA |
出版者 | SPIE-INT SOC OPTICAL ENGINEERING |
ISSN | 0277-786X |
ISBN | 978-0-8194-7006-5 |
部门归属 | [zeng, hualin; zhou, yan; fan, songtao; he, jun] chinese acad sci, inst semicond, beijing 100864, peoples r china |
摘要 | Based on the semiconductor laser whose spectral line with width is compressed to be less than 1.2Mhz, a system was designed to measure and improve the amplitude and frequency of the real-time microvibration with sinusoidal modulation. real-time microvibration measurement was executed without alignment problem in the interferometry; and low-frequency disturbance of environment could be eliminated. Suggestions were also given to consummate the system. The system also has resistance against the low frequency disturbance of the environment. |
关键词 | Measurement Of Microvibration Nanometrology Interferometry Vibration Detection |
学科领域 | 光电子学 |
主办者 | SPIE.; Chinese Opt Soc. |
收录类别 | CPCI-S |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/7808 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Zeng, HL, Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China. |
推荐引用方式 GB/T 7714 | Zeng, HL,Zhou, Y,Fan, ST,et al. Accurate vibration detection of a rough surface - art. no. 683118[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2008:6831: 83118-83118. |
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