Accurate vibration detection of a rough surface - art. no. 683118
Zeng, HL; Zhou, Y; Fan, ST; He, J; Zeng, HL, Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China.
2008
会议名称2nd Conference on Nanophotonics, Nanostructure and Nanometrology
会议录名称NANOPHOTONICS,NANOSTRUCTURE,AND NANOMETROLOGY II
页码6831: 83118-83118
会议日期NOV 12-14, 2007
会议地点Beijing, PEOPLES R CHINA
出版地1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
出版者SPIE-INT SOC OPTICAL ENGINEERING
ISSN0277-786X
ISBN978-0-8194-7006-5
部门归属[zeng, hualin; zhou, yan; fan, songtao; he, jun] chinese acad sci, inst semicond, beijing 100864, peoples r china
摘要Based on the semiconductor laser whose spectral line with width is compressed to be less than 1.2Mhz, a system was designed to measure and improve the amplitude and frequency of the real-time microvibration with sinusoidal modulation. real-time microvibration measurement was executed without alignment problem in the interferometry; and low-frequency disturbance of environment could be eliminated. Suggestions were also given to consummate the system. The system also has resistance against the low frequency disturbance of the environment.
关键词Measurement Of Microvibration Nanometrology Interferometry Vibration Detection
学科领域光电子学
主办者SPIE.; Chinese Opt Soc.
收录类别CPCI-S
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/7808
专题中国科学院半导体研究所(2009年前)
通讯作者Zeng, HL, Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China.
推荐引用方式
GB/T 7714
Zeng, HL,Zhou, Y,Fan, ST,et al. Accurate vibration detection of a rough surface - art. no. 683118[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2008:6831: 83118-83118.
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