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Effects of residual C and O impurities on photoluminescence in undoped GaN epilayers | |
Kang JY; Shen YW; Wang ZG; Kang JY Xiamen Univ Dept Phys Xiamen 361005 Peoples R China. | |
2002 | |
会议名称 | 9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX) |
会议录名称 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 91 |
页码 | 303-307 |
会议日期 | SEP 24-28, 2001 |
会议地点 | RIMINI, ITALY |
出版地 | PO BOX 564, 1001 LAUSANNE, SWITZERLAND |
出版者 | ELSEVIER SCIENCE SA |
ISSN | 0921-5107 |
部门归属 | xiamen univ, dept phys, xiamen 361005, peoples r china; chinese acad sci, inst semicond, lab semicond mat sci, beijing 100083, peoples r china |
摘要 | Photoluminescence (PL) was investigated in undoped GaN from 4.8 K to room temperature. The 4.8 K spectra exhibited recombinations of free exciton, donor-acceptor pair (DAP), blue and yellow bands (Ybs). The blue band (BB) was also identified to be a DAP recombination. The YB was assigned to a recombination from deep levels. The energy-dispersive X-ray spectroscopy show that C and O are the main residual impurities in undoped GaN and that C concentration is lower in the epilayers with the stronger BB. The electronic structures of native defects, C and O impurities, and their complexes were calculated using ab initio local-density-functional (LDF) methods with linear muffin-tin-orbital and 72-atomic supercell. The theoretical analyses suggest that the electron transitions from O-N states to C-N and to V-Ga states are responsible for DAP and the BB, respectively, and the electron transitions between the inner levels of the C-N-O-N complex may be responsible for the YB in our samples. (C) 2002 Elsevier Science B.V. All rights reserved. |
关键词 | Defects Gan Photoluminescence Electronic Structures Yellow Luminescence Epitaxial-films Mg |
学科领域 | 半导体材料 |
收录类别 | CPCI-S |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/14899 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Kang JY Xiamen Univ Dept Phys Xiamen 361005 Peoples R China. |
推荐引用方式 GB/T 7714 | Kang JY,Shen YW,Wang ZG,et al. Effects of residual C and O impurities on photoluminescence in undoped GaN epilayers[C]. PO BOX 564, 1001 LAUSANNE, SWITZERLAND:ELSEVIER SCIENCE SA,2002:303-307. |
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