Knowledge Management System Of Institute of Semiconductors,CAS
Structural optimizations of SOI-based single-mode rib waveguide bends | |
Chen, YY; Yan, QF; Yang, D; Chen, SW; Yu, JZ; Chen, YY, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China. | |
2004 | |
会议名称 | 7th International Conference on Solid-State and Integrated Circuits Technology |
会议录名称 | 2004 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY |
页码 | VOLS 1- 3 PROCEEDINGS: 2015-2017 |
会议日期 | OCT 18-21, 2004 |
会议地点 | Beijing, PEOPLES R CHINA |
出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA |
出版者 | IEEE |
ISBN | 0-7803-8511-X |
部门归属 | chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
摘要 | Effects of structure parameters on bend loss of rib silicon-on-insulator (Sol) bend waveguides have been analyzed by means of effective index method (EIM) and 2D bend loss formula. The simulation results indicate that the bend loss decreases with the increase of bend radius and waveguide width, as well as with the decrease of the step factor of the rib waveguide. Moreover, the optional structure parameters have been found when bend waveguides are single-mode. |
关键词 | Silicon-on-insulator Bend Waveguide Bend Loss Integrated Optics Silicon-on-insulator |
学科领域 | 光电子学 |
主办者 | Chinese Inst Elect.; IEEE Beijing Sect.; IEEE Elect Devices Soc.; IEEE EDS Beijing Chapter.; IEEE Solid-State Circuits Soc.; IEEE SSCS Beijing Chapter.; Japan Soc Appl Phys.; IEE Elect Div.; URSI Commiss D.; Inst Elect Engineers Korea.; Natl Nat Sci Fdn China.; Beijing Municipal Bureau Ind Dev.; Peking Univ. |
收录类别 | CPCI-S |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/10100 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Chen, YY, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China. |
推荐引用方式 GB/T 7714 | Chen, YY,Yan, QF,Yang, D,et al. Structural optimizations of SOI-based single-mode rib waveguide bends[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2004:VOLS 1- 3 PROCEEDINGS: 2015-2017. |
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